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Google Keyword Rankings for : semiconductor aging
1
http://analysistech.com/wp-content/uploads/2017/04/Fundamentals-of-Power-Cycling-2017.pdf
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http://analysistech.com/wp-content/uploads/2017/04/Fundamentals-of-Power-Cycling-2017.pdf
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2
https://spectrum.ieee.org/transistor-aging
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https://spectrum.ieee.org/transistor-aging
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3
https://audiosciencereview.com/forum/index.php?threads/what-causes-semiconductor-aging.31204/
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https://audiosciencereview.com/forum/index.php?threads/what-causes-semiconductor-aging.31204/
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4
https://engineering.purdue.edu/ece477/Course/Assignments/Reference/CMOS_failure_modes.pdf
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https://engineering.purdue.edu/ece477/Course/Assignments/Reference/CMOS_failure_modes.pdf
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5
https://www.sciencedirect.com/science/article/abs/pii/0026271484906437
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https://www.sciencedirect.com/science/article/abs/pii/0026271484906437
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6
https://d-nb.info/1023128659/34
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https://d-nb.info/1023128659/34
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7
https://c3.ndc.nasa.gov/dashlink/static/media/publication/2010_Autotestcon_PowerSemiconductor.pdf
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https://c3.ndc.nasa.gov/dashlink/static/media/publication/2010_Autotestcon_PowerSemiconductor.pdf
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8
https://aip.scitation.org/doi/pdf/10.1063/1.1589594
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https://aip.scitation.org/doi/pdf/10.1063/1.1589594
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9
https://semiwiki.com/eda/319691-clock-aging-issues-at-sub-10nm-nodes/
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https://semiwiki.com/eda/319691-clock-aging-issues-at-sub-10nm-nodes/
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10
https://www.researchgate.net/publication/224186439_Accelerated_aging_system_for_prognostics_of_power_semiconductor_devices
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https://www.researchgate.net/publication/224186439_Accelerated_aging_system_for_prognostics_of_power_semiconductor_devices
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11
https://pubmed.ncbi.nlm.nih.gov/23929110/
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https://pubmed.ncbi.nlm.nih.gov/23929110/
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12
https://www.arteris.com/blog/semiconductor-engineering-aging-problems-at-5nm-and-below
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https://www.arteris.com/blog/semiconductor-engineering-aging-problems-at-5nm-and-below
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13
https://www.cambridge.org/core/journals/materials-research-society-internet-journal-of-nitride-semiconductor-research/article/aging-mechanisms-of-inganalgangan-lightemitting-diodes-operating-at-high-currents/8E219CFDE45350F380C63C86BAECEEEB
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https://www.cambridge.org/core/journals/materials-research-society-internet-journal-of-nitride-semiconductor-research/article/aging-mechanisms-of-inganalgangan-lightemitting-diodes-operating-at-high-currents/8E219CFDE45350F380C63C86BAECEEEB
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14
https://www.mos-ak.org/lausanne_2017/presentations/T10_Salfelder_MOS-AK_DATE_2017.pdf
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https://www.mos-ak.org/lausanne_2017/presentations/T10_Salfelder_MOS-AK_DATE_2017.pdf
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15
https://www.youtube.com/watch?v=Ixxg7VvrpwU
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https://www.youtube.com/watch?v=Ixxg7VvrpwU
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16
http://przyrbwn.icm.edu.pl/APP/PDF/139/app139z5p11.pdf
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http://przyrbwn.icm.edu.pl/APP/PDF/139/app139z5p11.pdf
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17
https://www.linkedin.com/pulse/semiconductor-reliability-analysis-pct-accelerated-aging-peter-zhang?trk=public_post
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https://www.linkedin.com/pulse/semiconductor-reliability-analysis-pct-accelerated-aging-peter-zhang?trk=public_post
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18
https://www.electronicdesign.com/news/products/article/21768423/circuit-aging-a-new-phenomenon-for-soc-designs
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https://www.electronicdesign.com/news/products/article/21768423/circuit-aging-a-new-phenomenon-for-soc-designs
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19
https://apps.dtic.mil/sti/citations/ADA099439
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https://apps.dtic.mil/sti/citations/ADA099439
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20
https://www.york.ac.uk/physics-engineering-technology/research/communication-technologies/projects/electromagnetic-monitoring-semiconductor-ageing/
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https://www.york.ac.uk/physics-engineering-technology/research/communication-technologies/projects/electromagnetic-monitoring-semiconductor-ageing/
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21
https://patents.google.com/patent/US8823447B2/en
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https://patents.google.com/patent/US8823447B2/en
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22
https://www.chinoindia.com/productdetail/system/semiconductor/
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https://www.chinoindia.com/productdetail/system/semiconductor/
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23
https://curent.utk.edu/2021IndustryConference/Liu_Yunting_UTK_Tolbert_5.pdf
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https://curent.utk.edu/2021IndustryConference/Liu_Yunting_UTK_Tolbert_5.pdf
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24
https://www.eas.iis.fraunhofer.de/content/dam/eas/en/documents/print/wp-fraunhofer-eas-degradation.pdf
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https://www.eas.iis.fraunhofer.de/content/dam/eas/en/documents/print/wp-fraunhofer-eas-degradation.pdf
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25
https://toshiba.semicon-storage.com/us/semiconductor/knowledge/e-learning/discrete/chap5/chap5-12.html
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https://toshiba.semicon-storage.com/us/semiconductor/knowledge/e-learning/discrete/chap5/chap5-12.html
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26
https://www.tu-chemnitz.de/etit/le/Professur/Stellenausschreibungen/Dokumente/2022/Diss_1.pdf
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https://www.tu-chemnitz.de/etit/le/Professur/Stellenausschreibungen/Dokumente/2022/Diss_1.pdf
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27
https://sst.semiconductor-digest.com/2005/06/new-aging-mechanism-in-multilayer-ceramic-capacitators/
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https://sst.semiconductor-digest.com/2005/06/new-aging-mechanism-in-multilayer-ceramic-capacitators/
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28
https://www.bluem.com/industries/semiconductor-burn-in-oven
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https://www.bluem.com/industries/semiconductor-burn-in-oven
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29
https://ui.adsabs.harvard.edu/abs/1981aerc.rept.....J/abstract
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https://ui.adsabs.harvard.edu/abs/1981aerc.rept.....J/abstract
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30
https://link.springer.com/article/10.1007/BF02995713
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https://link.springer.com/article/10.1007/BF02995713
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31
https://www.etsc-tech.be/products/semiconductor-laser-diode-reliability-aging-test-system/
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https://www.etsc-tech.be/products/semiconductor-laser-diode-reliability-aging-test-system/
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32
https://accelrf.com/
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https://accelrf.com/
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33
https://digitalcommons.unl.edu/electricalengineeringfacpub/492/
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https://digitalcommons.unl.edu/electricalengineeringfacpub/492/
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34
https://twitter.com/hscpoly/status/1525141083872698369
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https://twitter.com/hscpoly/status/1525141083872698369
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35
https://search.proquest.com/openview/853af2153d3ff723200a60e9627ca40b/1?pq-origsite=gscholar&cbl=1936364
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https://search.proquest.com/openview/853af2153d3ff723200a60e9627ca40b/1?pq-origsite=gscholar&cbl=1936364
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36
https://upcommons.upc.edu/handle/2117/369979
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https://upcommons.upc.edu/handle/2117/369979
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37
https://ieeecs-media.computer.org/computing-now/2015/dan-alexandrescu-on-aging-semiconductors.pdf
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https://ieeecs-media.computer.org/computing-now/2015/dan-alexandrescu-on-aging-semiconductors.pdf
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38
https://www.mdpi.com/1996-1073/15/23/9104/pdf?version=1669879336
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https://www.mdpi.com/1996-1073/15/23/9104/pdf?version=1669879336
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39
https://www.ti.com/support-quality/reliability/reliability-testing.html
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https://www.ti.com/support-quality/reliability/reliability-testing.html
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40
https://www.walmart.ca/en/ip/Voltage-Rectifier-Motorcycle-Rectifier-Semiconductor-Diode-Aluminium-Alloy-Anti-Aging-For-Motorbike/PRD2JOCDQ7P4LOE
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https://www.walmart.ca/en/ip/Voltage-Rectifier-Motorcycle-Rectifier-Semiconductor-Diode-Aluminium-Alloy-Anti-Aging-For-Motorbike/PRD2JOCDQ7P4LOE
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41
https://onlinelibrary.wiley.com/doi/abs/10.1002/pen.760280402
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https://onlinelibrary.wiley.com/doi/abs/10.1002/pen.760280402
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42
https://www.aliexpress.com/item/1005004074517337.html
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https://www.aliexpress.com/item/1005004074517337.html
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43
https://go.gale.com/ps/i.do?id=GALE%7CA369129690&sid=googleScholar&v=2.1&it=r&linkaccess=abs&issn=1687563X&p=AONE&sw=w
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https://go.gale.com/ps/i.do?id=GALE%7CA369129690&sid=googleScholar&v=2.1&it=r&linkaccess=abs&issn=1687563X&p=AONE&sw=w
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44
https://www.indiesemi.com/foundry-and-reliability-engineer
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https://www.indiesemi.com/foundry-and-reliability-engineer
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45
https://www.nytimes.com/topic/company/taiwan-semiconductor-manufacturing-company-ltd
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https://www.nytimes.com/topic/company/taiwan-semiconductor-manufacturing-company-ltd
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46
https://cyberleninka.org/article/n/614372
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https://cyberleninka.org/article/n/614372
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47
https://www.st.com/resource/en/application_note/cd00003986-introduction-to-semiconductor-technology-stmicroelectronics.pdf
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https://www.st.com/resource/en/application_note/cd00003986-introduction-to-semiconductor-technology-stmicroelectronics.pdf
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48
https://openresearchlibrary.org/ext/api/media/9f7ae4c8-5aac-4572-abe3-efc981ca4ac6/assets/external_content.pdf
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https://openresearchlibrary.org/ext/api/media/9f7ae4c8-5aac-4572-abe3-efc981ca4ac6/assets/external_content.pdf
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49
https://pubs.acs.org/doi/abs/10.1021/am900855s
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https://pubs.acs.org/doi/abs/10.1021/am900855s
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50
https://www.bloomberg.com/news/audio/2022-07-28/semiconductor-production-in-the-us-audio
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https://www.bloomberg.com/news/audio/2022-07-28/semiconductor-production-in-the-us-audio
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51
https://www.electrochem.org/dl/ma/206/pdfs/1026.pdf
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https://www.electrochem.org/dl/ma/206/pdfs/1026.pdf
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52
https://www.semi.org/en/blogs/semi-news/alternative-career-paths-help-meet-semiconductor-industry-workforce-needs
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https://www.semi.org/en/blogs/semi-news/alternative-career-paths-help-meet-semiconductor-industry-workforce-needs
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53
https://www.navsea.navy.mil/Portals/103/Documents/NSWC_Crane/SD-18/Test%20Methods/MILSTD750.pdf
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https://www.navsea.navy.mil/Portals/103/Documents/NSWC_Crane/SD-18/Test%20Methods/MILSTD750.pdf
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54
https://www.techspot.com/news/88838-china-use-aging-chips-while-semiconductor-industry-catches.html
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https://www.techspot.com/news/88838-china-use-aging-chips-while-semiconductor-industry-catches.html
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55
https://www.indiamart.com/proddetail/semiconductor-aging-testing-equipment-1923286673.html
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https://www.indiamart.com/proddetail/semiconductor-aging-testing-equipment-1923286673.html
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56
https://www.semanticscholar.org/paper/BPDA-PDA-Polyimide%3A-Synthesis%2C-Characterizations%2C-Diaham-Locatelli/382297d5fb0cccc75b3ef44ebc6da585e64d3e58
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https://www.semanticscholar.org/paper/BPDA-PDA-Polyimide%3A-Synthesis%2C-Characterizations%2C-Diaham-Locatelli/382297d5fb0cccc75b3ef44ebc6da585e64d3e58
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57
https://www.glassdoor.com/Reviews/Employee-Review-NXP-Semiconductors-RVW53227366.htm
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https://www.glassdoor.com/Reviews/Employee-Review-NXP-Semiconductors-RVW53227366.htm
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58
https://www.osti.gov/servlets/purl/5032834
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https://www.osti.gov/servlets/purl/5032834
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59
https://www.kemet.com/
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https://www.kemet.com/
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60
https://www.nber.org/digest/jul15/how-fast-are-semiconductor-prices-falling
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https://www.nber.org/digest/jul15/how-fast-are-semiconductor-prices-falling
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61
https://news.knowledia.com/US/en/articles/what-causes-semiconductor-aging-862d7809473a86cef51e848a90fb3a33ef8683e5
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https://news.knowledia.com/US/en/articles/what-causes-semiconductor-aging-862d7809473a86cef51e848a90fb3a33ef8683e5
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62
https://www.csis.org/analysis/reshoring-semiconductor-manufacturing-addressing-workforce-challenge
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https://www.csis.org/analysis/reshoring-semiconductor-manufacturing-addressing-workforce-challenge
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63
https://www.alpinepolytech.com/semiconductor/
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https://www.alpinepolytech.com/semiconductor/
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64
https://mospace.umsystem.edu/xmlui/bitstream/handle/10355/83802/Hanif_umkc_0134D_11668.pdf?sequence=1&isAllowed=y
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https://mospace.umsystem.edu/xmlui/bitstream/handle/10355/83802/Hanif_umkc_0134D_11668.pdf?sequence=1&isAllowed=y
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65
https://www.weforum.org/agenda/2022/05/global-chip-shortages-put-life-saving-medical-devices-at-risk/
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https://www.weforum.org/agenda/2022/05/global-chip-shortages-put-life-saving-medical-devices-at-risk/
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66
https://www.vertech.com/case-studies/upgrading-an-aging-rockwell-based-control-system-with-minimal-downtime
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https://www.vertech.com/case-studies/upgrading-an-aging-rockwell-based-control-system-with-minimal-downtime
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67
https://www.eetimes.com/the-lifetime-of-a-human-and-semiconductor/
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https://www.eetimes.com/the-lifetime-of-a-human-and-semiconductor/
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68
https://www.infineon.com/cms/pdflink/en/36335d6f-c1c6-11e6-9920-40f2e90e8d04/346317-Doctoral-Thesis-Characterization-and-Modelling-of-Aging-Behavior-of-Power-Semiconductor-Devices-f-m-div.pdf
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https://www.infineon.com/cms/pdflink/en/36335d6f-c1c6-11e6-9920-40f2e90e8d04/346317-Doctoral-Thesis-Characterization-and-Modelling-of-Aging-Behavior-of-Power-Semiconductor-Devices-f-m-div.pdf
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69
https://www.eternal-technologies.com/upload/file/dianyuan/LHX-302-COC-EN.pdf
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https://www.eternal-technologies.com/upload/file/dianyuan/LHX-302-COC-EN.pdf
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70
https://iopscience.iop.org/article/10.1149/MA2005-01/28/975
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https://iopscience.iop.org/article/10.1149/MA2005-01/28/975
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71
https://research.caluniv.ac.in/publication/ageing-of-metal-semiconductor-field-effect-transistors
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https://research.caluniv.ac.in/publication/ageing-of-metal-semiconductor-field-effect-transistors
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72
https://www.worldhealth.net/news/researchers_make_semiconductor_from_brai
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https://www.worldhealth.net/news/researchers_make_semiconductor_from_brai
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73
https://www.google.com.pg/patents/US4691186
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https://www.google.com.pg/patents/US4691186
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74
https://www.nextbigfuture.com/2021/12/vertical-semiconductor-breakthrough-for-85-less-energy-usage.html
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https://www.nextbigfuture.com/2021/12/vertical-semiconductor-breakthrough-for-85-less-energy-usage.html
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75
https://engineering.stanford.edu/magazine/article/transistor-aging-research-can-keep-chips-working-longer-reduce-early-breakdowns
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https://engineering.stanford.edu/magazine/article/transistor-aging-research-can-keep-chips-working-longer-reduce-early-breakdowns
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76
https://www.yuanyao-tech.com/semiconductor-environment-test-equipment.html
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https://www.yuanyao-tech.com/semiconductor-environment-test-equipment.html
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77
https://eprints.whiterose.ac.uk/81433/
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https://eprints.whiterose.ac.uk/81433/
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78
https://www.onsemi.com/pub/Collateral/HBD854-D.PDF
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https://www.onsemi.com/pub/Collateral/HBD854-D.PDF
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79
https://publikationen.bibliothek.kit.edu/1000136301
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https://publikationen.bibliothek.kit.edu/1000136301
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80
https://vbn.aau.dk/en/projects/online-condition-monitoring-of-power-semiconductor-devices-using-
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https://vbn.aau.dk/en/projects/online-condition-monitoring-of-power-semiconductor-devices-using-
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81
http://nfml.yonsei.ac.kr/gnuboard4/data/file/publication/2776907207_uyBKncEa_2010-04_ACS-Applied-Materials-and-Interfaces.pdf
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http://nfml.yonsei.ac.kr/gnuboard4/data/file/publication/2776907207_uyBKncEa_2010-04_ACS-Applied-Materials-and-Interfaces.pdf
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82
https://tches.iacr.org/index.php/TCHES/article/download/8295/7645/4488
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https://tches.iacr.org/index.php/TCHES/article/download/8295/7645/4488
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83
https://sterigenics.com/industries/advanced-radiation-processing/semiconductor-material-modification/
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https://sterigenics.com/industries/advanced-radiation-processing/semiconductor-material-modification/
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84
https://www.chegg.com/homework-help/questions-and-answers/8-2pt-aging-reliability-certain-cooled-2509-laser-device-specified-lifetime-25-years-2x10--q97853917
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https://www.chegg.com/homework-help/questions-and-answers/8-2pt-aging-reliability-certain-cooled-2509-laser-device-specified-lifetime-25-years-2x10--q97853917
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85
https://www.freepatentsonline.com/4977441.html
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https://www.freepatentsonline.com/4977441.html
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86
https://www.kessystemsinc.com/resources/an-introduction-to-semiconductor-burn-in/
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https://www.kessystemsinc.com/resources/an-introduction-to-semiconductor-burn-in/
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87
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